What does a ToF-SIMS do?
ToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples.
How do you read ToF on SIMS spectra?
TOF-SIMS spectra are typically displayed as a plot of signal intensity or ion counts on the Y-axis versus m/z on the X-axis. The height of a signal is proportional to the amount of that ion present in the spectrum and the m/z of the ion is basically the mass of that ion (if it is singly charged).
What is sputtering in ToF-SIMS?
ToF-SIMS uses the particles sputtered as ions from a surface to characterise the chemical nature of the material under analysis. Secondary ions are produced by bombarding the surface of the sample with a finely focused beam of primary ions at keV energies, which is produced by means of an ion gun.
Can ToF-SIMS provide quantitative information about sample surface composition?
Such a platform enables qualitative and quantitative measurements of surface composition for the fine spray dried ASD particles with ultrasurface-sensitivity (less than 10 nm from the surface) and superior spatial resolution (approximately 250 nm for ToF-SIMS).
How does secondary ion mass spectrometry work?
Secondary ion mass spectrometry (SIMS) is a technique used to analyze compositions of thin films and surfaces by using a focused primary ion beam to sputter the surface of a sample and analyze the ejected secondary ions.
What is GC MS analysis?
Gas Chromatography/Mass Spectrometry, or GC/MS analysis, is an analytical method that combines the features of gas chromatography and mass spectrometry to identify different substances within a sample component matrix. GC/MS analysis is generally considered one of the most accurate analyses available.
How does a secondary mass spectrometer work?
Secondary Ion Mass Spectrometer (SIMS) Instrumentation – How Does It Work? the electrostatic filter reduces the energy range of the secondary ions so that they can then be separated into independent ion beams (based on the charge/mass ratio) by passing them through a magnetic field (magnetic sector).
Which source is used for secondary ion mass spectrometry?
While a gallium source is able to operate with elemental gallium, recently developed sources for gold, indium and bismuth use alloys which lower their melting points. The LMIG provides a tightly focused ion beam (<50 nm) with moderate intensity and is additionally able to generate short pulsed ion beams.
Why is ICP better than AAS?
ICP is the method of choice when you want to measure multiple elements. In a nutshell: AAS is cheaper but can only determine the concentration of a particular element. ICP-MS is more expensive but faster, more sensitive and can analyze multiple elements simultaneously (can detect down to PPT levels!).
What does Maldi Tof measure?
During MALDI-TOF analysis, the m/z ratio of an ion is measured by determining the time required for it to travel the length of the flight tube. A few TOF analyzers incorporate an ion mirror at the rear end of the flight tube, which serves to reflect back ions through the flight tube to a detector.
What is the resolution of TOF-SIMS analysis?
Because it is possible to measure the “time-of-flight” of the particles from the time of impact to detector on a scale of nano-seconds, it is possible to produce a mass resolution as fine as 0.00X atomic mass units (i.e. one part in a thousand of the mass of a proton). Under typical operating conditions, the results of ToF-SIMS analysis include:
What is imaging TOF SIMS?
Imaging TOF SIMS provides spatial distribution of different species to yield surface reactivity maps. Its high mass resolution and high mass range makes this system adept at both elemental and molecular surface analysis.
What does TOF-SIMS stand for?
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular ions with mass-to-charge ratios ranging from m/z 1 to m/z 10,000 in a single spectrum. Combined with this molecular specificity, the technique can provide chemical images with
What is the strength of TOF-SIMS?
The strength of ToF-SIMS lies in its capability to detect and identify multiple chemical species inside a 3D space without the need for a marker.